Multiple Experiment Environments for Testing

نویسندگان

  • Karen Panetta
  • Elias S. Manolakos
  • Edward C. Czeck
  • Jamie A. Heller
چکیده

Concurrent simulation (CS) has been used successfully as a replacement for serial simulation. Based on storing diierences from experiments, CS saves storage, speeds up simulation time and allows excellent internal observation of events. In this paper, we introduce Multiple Domain Concurrent Simulation (MDCS) which like concurrent simulation, maintains eeciency by only simulating diierences. MDCS also allows experiments to interact with one another and create new experiments through the use of domains. These experiments can be traced and observed at any point, providing insight into the origin and causes of new experiments. While many experiment scenarios can be created, MDCS uses dynamic spawning and experiment compression rather than explicit enumeration to ensure that the number of experiment scenarios does not become exhaustive. MDCS does not require any pre-analysis or additions to the circuit under test. Providing this capability in digital logic simulators allows more test cases to be run in less time. MDCS gives the exact location and causes of every experiment behavior and can be used to track the signature paths of test patterns for coverage analysis. We will describe the algorithms for MDCS, discuss the rules for propagating experiments and describe the concepts of domains for making dynamic interactions possible. We will report on the eeectiveness of MDCS for attacking an exhaustive simulation problem such as Multiple Stuck-at Fault simulations for digital logic. Finally, the applicability of MDCS for more general experimentation of digital logic systems will be discussed.

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عنوان ژورنال:
  • J. Electronic Testing

دوره 11  شماره 

صفحات  -

تاریخ انتشار 1997